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Etching

To reduce the chamber-to-chamber variation and to optimize the yield of an etching tool, HORIBA offers a wide range of fluid control modules and smart sensors for endpoint detection and chamber health monitoring. Compact and robust, they can be used for R&D and for Production.

Etching is used in microfabrication to chemically remove layers from the surface of a wafer during manufacturing. Etching is a critically important process module, and every wafer undergoes many etching steps before it is complete.

For many etching steps, part of the wafer is protected from the etchant by a "masking" material which resists etching. In some cases, the masking material is a photoresist which has been patterned using photolithography. Other situations require a more durable mask, such as silicon nitride.

Dry etching refers to the removal of material, typically a masked pattern of semiconductor material, by exposing the material to a bombardment of ions (usually a plasma of reactive gases such as fluorocarbons, oxygen, chlorine, boron trichloride; sometimes with addition of nitrogen, argon, helium and other gases) that dislodge portions of the material from the exposed surface. A common type of dry etching is reactive-ion etching. Unlike with many (but not all, see isotropic etching) of the wet chemical etchants used in wet etching, the dry etching process typically etches directionally or anisotropically.

Fluid Controller & Module

GR-511F
GR-511F

Wafer Back Side Cooling System

D700MG
D700MG

High Speed & Precision Pressure Insensitive Mass Flow Module

D700WR
D700WR

Wide Range Pressure Insensitive Mass Flow Module

CRITERION D500
CRITERION D500

Pressure Insensitive Mass Flow Module

DZ-100
DZ-100

Ultra-thin Mass Flow Module

FS-3000
FS-3000

Thermal Flow Splitter

SEC-Z500X Series
SEC-Z500X Series

Multi Range/Multi Gas Digital Mass Flow Controller

SEC-Z700S Series
SEC-Z700S Series

New concept Pressure Insensitive Mass Flow Module

SEC-Z700X Series
SEC-Z700X Series

Pressure Insensitive Mass Flow Controller

VC Series
VC Series

Direct Liquid Injection System

PV Series
PV Series

Piezo Actuator Valve

UR-Z700 Series
UR-Z700 Series

Digital Automatic Pressure Regulator

GR-300 Series
GR-300 Series

Wafer Back Side Cooling System

HORIBA's expertise in analytical instrumentation has provided the foundations for a range of successful industrial monitoring tools for the semiconductor, pharmaceutical and chemical industries.

With its new compact design and enhanced image quality, the LEM interferometer for in-situ etch rate monitoring and end-point detection can be mounted on any process chamber with a direct top view of the wafer. It provides a real-time digital CCD image of the sample surface, making its 30-m laser beam positioning simple and accurate. Based on interferometry technique, the LEM provide in-situ etch/growth rate monitoring for endpoint detection of a wide range of dry etch applications.

Process Monitor & Endpoint Detector

Micropole System QL Series
Micropole System QL Series

Quadrupole Mass Analyzer

VG-200S
VG-200S

Capacitance Manometer

EV 2.0 Series
EV 2.0 Series

Endpoint / Chamber Health Monitor based on Optical Emission Spectroscopy and MWL Interferometry

EV-140C
EV-140C

Optical Emission Spectroscopy Etching End-point Monitor

IT-480 series
IT-480 series

High-Accuracy Infrared Thermometers [Stationary type]

IT-270
IT-270

High-Accuracy Infrared Thermometer [Built-in type]

LEM Series
LEM Series

Camera Endpoint Monitor based on Real Time Laser Interferometry

VS70-MC
VS70-MC

Miniature Multi Communication UV-NIR Spectrometer

OES-Star
OES-Star

UV-VIS-NIR Spectrometer

PoliSpectra® M116 MultiTrack Spectrometer
PoliSpectra® M116 MultiTrack Spectrometer

Multispectra, Multifiber, Multichannel Imaging spectrometer with 8-16-32 Simultaneous UV-NIR Spectra

VU90 Spectrometer
VU90 Spectrometer

Most Compact Vacuum UV Back-Illuminated CCD Spectrometer (VUV-FUV)

RU-1000
RU-1000

Plasma Emission Controller

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