In the realm of advanced materials, primary metals are critical for fields such as aerospace, automotive, electronics, and medical devices. Ensuring the quality and performance of these metals requires extensive analysis.
The X-ray analysis method (XRF) is excellent for simultaneous quantitative analysis of multiple elements and is nondestructive and rapid. This method is complementary with Non-Dispersive Infrared Spectroscopy (NDIR) method is suitable for highly sensitive determination of specific elements (mainly Carbon, Sulfur, Hydrogen and Oxygen).
By providing detailed information about the distribution of elements as a function of depth, Glow Discharge Optical Emission Spectroscopy (GDOES) is ideal for trace element analysis and analysis of metal coatings, and helps in understanding material properties, improving manufacturing processes, and ensuring quality control.
Single-, multi-point elemental analysis and elemental mapping analysis can be performed using µ-XRF, which focuses X-rays and enables elemental analysis of small areas.
Particle Characterization Analyzers (PCA) provides precise measurements of particle size distribution, essential for understanding the flow properties and sintering behavior of metal powders.
Raman spectroscopy and other spectroscopic techniques can be used to analyze the crystal structure and microstructure of metal oxides and metal complexes which are easily distinguished by their characteristic spectra.
Atomic Force Microscopy (AFM) can assess surface roughness, coatings, and treatments to ensure proper adhesion, corrosion resistance, and overall surface integrity.
HORIBA provides advanced analytical instruments and solutions that significantly aid in the analysis of metals.
Carbon/Sulfur Analyzer
(Flagship High-Accuracy Model)
Oxygen/Nitrogen/Hydrogen Analyzer
(Flagship High-Accuracy Model)
Pulsed-RF Glow Discharge Optical Emission Spectrometer
X-ray Analytical Microscope (Micro-XRF)
Laser Scattering Particle Size Distribution Analyzer
Nanoparticle Analyzer
Raman Spectroscope - Automated Imaging Microscope
Scanning Probe Microscope with Chemical Signature
BET Flowing Gas Surface Area Analyzers
Carbon/Sulfur Analyzer (Entry Model)
Oxygen/Nitrogen Analyzer (Entry Model)
Static Image Analysis System Particle Size
Simultaneous Multi-Laser Nanoparticle Tracking Analysis (NTA)
X-Ray Fluorescence Analyzer
MicroRaman Spectrometer - Confocal Raman Microscope
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