Spectral coverage

With 532 nm laser:210 to 3500 cm^–1
With 660 nm laser:400 to 3150 cm^–1
With 785 nm laser:210 to 2700 cm^–1

Numerical aperture

F/3.1

Stray light rejection
Typical (Maximum)

0.1% (0.2%)
(measured with bandpass filter 780BP10)

CCD Detector & Typical Q.E.

Back-illuminated CCD with low etaloning in NIR
55% peak QE at 850nm(VIS optimized)

Detector height
Fiber-optic option

300μm CCD height standard (1000μm optional)
200 or 300μm dia.,1m long fiber optic (for 1mm tall CCD, RTS bundle is offered)

Thermoelectric stabilization

None. Dark current and CCD-pattern noise must be subtracted. User must shutter in optical path. QE shifts slightly with temperature.

Spectral resolution
Pixel resolution
Slit (factory configuration)

785nm configuration;25μm slit; 2048 pixels; 8–12cm^–1 resolution; 0.19nm/pixel (configuration with 300μm tall CCD)
Available slits: 12-25-37-50-62-75-100-125-150-200μm (contact us for other gratings)

Improved CCD full well
Raw non linearity
Factory corrected non linearity

>250Ke^- (sensitivity mode)
<1% (sensitivity mode)

< 0.4% (sensitivity mode)

Typical dynamic range

7000:1 in sensitivity mode
 

Readout speed

8.6ms (500kHz mode); 116 spectra/s with 0 exposure time (Multi-Acq mode)
Max: 4.5 ms (Ultra mode); 223 spectra/s with 0 exposure time (Multi-Acq mode)

Typical Dark current

1 count/ms at 20°C (room temp.); typical offset = 1000 counts

Typical readout noise

35 e^- (Max= 45e^-) in sensitivity mode (4 e^–/count)

A/D converter

16 bit, 500 kHz (pixel rate); optional 2 MHz VIS-CCD

Typical dynamic range

7,000:1 in sensitivity mode

Weight

1.8 lb (0.82 kg)

Gain selection

4 e^-/count and 8 e^-/count

Dimensions (H×  W×D)

4” × 2.71” × 1.49” (101.6 mm × 68.8 mm × 37.8 mm)

* Specifications, Form Factor and Spectrometer Covers are subject to change without notice.