Reticle / Mask Particle Detection System
Complete particle detection and removal with one machine for enhanced efficiency and yield improvement in semiconductor manufacturing processes
Since its launch in 1984, the PD series of particle detection systems, indispensable to the semiconductor lithography process, has continued to evolve in response to customers’ needs and this year marks its 40th anniversary.
The new product "PD10-EX" is based on the popular conventional model "PD10" and is equipped with a particle removal function, making it possible to complete detection and removal with one device.
Furthermore, we have developed an in-house unit that supports automatic reticle/mask transport, contributing to more efficient semiconductor manufacturing processes and higher yields.
Analysis, measurement, and control needs in the semiconductor industry are changing at an unprecedented pace, becoming more sophisticated and diverse. We are working on expanding the functionality of the PD10-EX so that it can perform one-stop analysis of particle composition and measurement of pellicle※1 film thickness, and we will continue to present new possibilities in the future.
Selection of countries and territories where this product is available:
China,Germany,Ireland,Israel,Italy,Korea (South),Malaysia,Singapore,Taiwan,United Kingdom,United States
View the complete list
here.
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